#SMART PIXEL DETECTOR ARRAY SOFTWARE#
When combined with the HyPix series multidimensional pixel detector, the HyRES unit allows the user to seamlessly switch between the two optical systems through software control without a need of switching the optics hardware. OSTI. This detector performs an on-chip electronic signal processing that extracts the optically sectioned image. This is a receiving optical device that has two optical paths: a slit optical system and a high-resolution optical system with an analyzer crystal. Optical sectioning in wide-field microscopy is achieved by illumination of the object with a continuously moving single-spatial-frequency pattern and detecting the image with a smart pixel detector array. The HyRES has been designed to simplify this switching process. Therefore, the ability to switch between the slit optical system, which has a relatively low resolution, for the axial adjustment and the high-resolution analyzer-crystal optical system for actual data collection will enhance the efficiency of the whole process. 32x32 pixel array I2C PLL 1.6mm 1MS/s-pixel 100ps resolution. There are also some types of measurements that do not require the high-resolution optics. SPAD Pixel Detectors with High Time Resolution Edoardo Charbon TU Delft. This procedure, called “axial adjustment,” sometimes requires a modest resolution optics because the reflections can be difficult to find when the crystal orientation is tilted or the lattice constants are different from the literature values. Generally, before the measurement of a sample with high crystallinity, such as a single crystal substrate or an epitaxial film, it is necessary to adjust the crystal orientation of the sample so that the measurement direction with a goniometer matches the crystal orientation. Our 8x8 arrays are installed inside a tiny. All our thermopile arrays have a built-in EEPROM for storage of calibration data. They provide either wide fields-of-view with over 90° or narrow fields-of-view for measurements and detection from a greater distance. However, it still requires a timeconsuming re-alignment process when, for example, switching the optics between the standard and the highresolution optical systems, which use the slits and an analyzer crystal, respectively. All our thermopile infrared array sensor chips can be combined with different optics. Rigaku’s multipurpose X-ray diffractometer, “SmartLab,” features an automatic alignment function, which greatly simplifies the process. Diffraction-based characterization of epitaxial thin films, such as the measurement of the composition, strain, and lattice constants, requires complicated alignment processes of the X-ray optics.